This paper describes in detail the theoretical and experimental design of the in-plane thermal diffusivity of high thermal conductivity micron film samples using the TA instrument xenon lamp thermal conductivity meter DXF200. The 25 micron graphite film has been repeatedly tested. The reliability of the system was proved by verifying the thermal diffusivity of the standard sample copper. The graphite film was subjected to 8 pulse tests, and the experimental data had a high degree of fitting with the theoretical model and excellent repeatability.
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